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Beam profiling of a commercial lens-assisted terahertz time domain spectrometer

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Title: Beam profiling of a commercial lens-assisted terahertz time domain spectrometer
Authors: Freer, S
Gorodetsky, A
Navarro-Cia, M
Item Type: Journal Article
Abstract: To undertake THz spectroscopy and imaging, and accurately design and predict the performance of quasi-optical components, knowledge of the parameters of the beam (ideally Gaussian) emitted from a THz source is paramount. Despite its proliferation, relatively little work has been done on this in the frame of broadband THz photoconductive antennas. Using primarily pinhole scanning methods, along with stepwise angular spectrum simulations, we investigate the profile and polarization characteristics of the beam emitted by a commercial silicon-lensintegrated THz photoconductive antenna and collimated by a TPX (polymethylpentene) lens. Our study flags the limitations of the different beam profiling methods and their impact on the beam Gaussianity estimation. A non-Gaussian asymmetric beam is observed, with main lobe beam waists along x and y varying from 8.4 ± 0.7 mm and 7.7±0.7 mm at 0.25THz,to1.4±0.7 mm and 1.4 ± 0.7 mm at 1 THz, respectively. Additionally, we report a maximum cross-polar component relative to the ON-axis co-polar component of -11.6 dB and -21.2 dB, at 0.25 THz and 1 THz, respectively.
Issue Date: 1-Jan-2021
Date of Acceptance: 16-Sep-2020
URI: http://hdl.handle.net/10044/1/88796
DOI: 10.1109/TTHZ.2020.3026656
ISSN: 2156-342X
Publisher: Institute of Electrical and Electronics Engineers
Start Page: 90
End Page: 100
Journal / Book Title: IEEE Transactions on Terahertz Science and Technology
Volume: 11
Issue: 1
Copyright Statement: © 2020 The Author(s). This work is licensed under a Creative Commons Attribution 4.0 License. For more information, see https://creativecommons.org/licenses/by/4.0/
Keywords: Science & Technology
Technology
Physical Sciences
Engineering, Electrical & Electronic
Optics
Physics, Applied
Engineering
Physics
Beam profile
edge diffraction
Gaussian beam
imaging
quasi-optics
terahertz
time-domain spectrometer
Science & Technology
Technology
Physical Sciences
Engineering, Electrical & Electronic
Optics
Physics, Applied
Engineering
Physics
Beam profile
edge diffraction
Gaussian beam
imaging
quasi-optics
terahertz
time-domain spectrometer
0205 Optical Physics
0906 Electrical and Electronic Engineering
Publication Status: Published
Open Access location: https://doi.org/10.1109/TTHZ.2020.3026656
Online Publication Date: 2020-09-24
Appears in Collections:Physics
Experimental Solid State



This item is licensed under a Creative Commons License Creative Commons