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Beam profiling of a commercial lens-assisted terahertz time domain spectrometer
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09205572.pdf | Published version | 4.06 MB | Adobe PDF | View/Open |
Title: | Beam profiling of a commercial lens-assisted terahertz time domain spectrometer |
Authors: | Freer, S Gorodetsky, A Navarro-Cia, M |
Item Type: | Journal Article |
Abstract: | To undertake THz spectroscopy and imaging, and accurately design and predict the performance of quasi-optical components, knowledge of the parameters of the beam (ideally Gaussian) emitted from a THz source is paramount. Despite its proliferation, relatively little work has been done on this in the frame of broadband THz photoconductive antennas. Using primarily pinhole scanning methods, along with stepwise angular spectrum simulations, we investigate the profile and polarization characteristics of the beam emitted by a commercial silicon-lensintegrated THz photoconductive antenna and collimated by a TPX (polymethylpentene) lens. Our study flags the limitations of the different beam profiling methods and their impact on the beam Gaussianity estimation. A non-Gaussian asymmetric beam is observed, with main lobe beam waists along x and y varying from 8.4 ± 0.7 mm and 7.7±0.7 mm at 0.25THz,to1.4±0.7 mm and 1.4 ± 0.7 mm at 1 THz, respectively. Additionally, we report a maximum cross-polar component relative to the ON-axis co-polar component of -11.6 dB and -21.2 dB, at 0.25 THz and 1 THz, respectively. |
Issue Date: | 1-Jan-2021 |
Date of Acceptance: | 16-Sep-2020 |
URI: | http://hdl.handle.net/10044/1/88796 |
DOI: | 10.1109/TTHZ.2020.3026656 |
ISSN: | 2156-342X |
Publisher: | Institute of Electrical and Electronics Engineers |
Start Page: | 90 |
End Page: | 100 |
Journal / Book Title: | IEEE Transactions on Terahertz Science and Technology |
Volume: | 11 |
Issue: | 1 |
Copyright Statement: | © 2020 The Author(s). This work is licensed under a Creative Commons Attribution 4.0 License. For more information, see https://creativecommons.org/licenses/by/4.0/ |
Keywords: | Science & Technology Technology Physical Sciences Engineering, Electrical & Electronic Optics Physics, Applied Engineering Physics Beam profile edge diffraction Gaussian beam imaging quasi-optics terahertz time-domain spectrometer Science & Technology Technology Physical Sciences Engineering, Electrical & Electronic Optics Physics, Applied Engineering Physics Beam profile edge diffraction Gaussian beam imaging quasi-optics terahertz time-domain spectrometer 0205 Optical Physics 0906 Electrical and Electronic Engineering |
Publication Status: | Published |
Open Access location: | https://doi.org/10.1109/TTHZ.2020.3026656 |
Online Publication Date: | 2020-09-24 |
Appears in Collections: | Physics Experimental Solid State |
This item is licensed under a Creative Commons License