65
IRUS Total
Downloads
  Altmetric

Exploring and controlling intrinsic defect formation in SnO2 thin films

File Description SizeFormat 
c5tc03520a.pdfPublished version3.01 MBAdobe PDFView/Open
Title: Exploring and controlling intrinsic defect formation in SnO2 thin films
Authors: Porte, Y
Maller, R
Faber, H
Alshareef, H
Anthopoulos, T
McLachlan, MA
Item Type: Journal Article
Issue Date: 15-Dec-2015
Date of Acceptance: 15-Dec-2015
URI: http://hdl.handle.net/10044/1/32651
DOI: https://dx.doi.org/10.1039/C5TC03520A
ISSN: 2050-7534
Publisher: Royal Society of Chemistry
Start Page: 758
End Page: 765
Journal / Book Title: Journal of Materials Chemistry C
Volume: 4
Copyright Statement: This article is licensed under a Creative Commons Attribution 3.0 Unported Licence.
Sponsor/Funder: Kaust
Funder's Grant Number: N/A
Keywords: Science & Technology
Technology
Physical Sciences
Materials Science, Multidisciplinary
Physics, Applied
Materials Science
Physics
TRANSPARENT CONDUCTING OXIDES
INDIUM-TIN-OXIDE
WORK FUNCTION
ZINC-OXIDE
SURFACE-ROUGHNESS
LASER ABLATION
HYDROGEN
DEVICES
Publication Status: Published
Appears in Collections:Materials
Physics
Experimental Solid State
Faculty of Natural Sciences