Characterisation of defects in waveguides formed by electron irradiation of silica-on-silicon

Title:	Characterisation of defects in waveguides formed by electron irradiation of silica-on-silicon
Authors:	Spaargaren,S.M.R. Syms,R.R.A.
Item Type:	Journal Article
Content Version:	Published version
Issue Date:	1-Apr-2000
Citation:	IEEE Lightwave Technology Vol.( 18 ) No.( 4 ) pp 555 - 561
URI:	http://hdl.handle.net/10044/1/981
Publisher Link:	http://dx.doi.org/10.1109/50.838130
ISSN:	0733-8724
Start Page:	555
End Page:	561
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Volume:	18
Appears in Collections:	Optical and Semiconductor Devices