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Electronegativity and doping in Si1-xGex alloys
File | Description | Size | Format | |
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Electronegativity and doping.pdf | Published version | 9.87 MB | Adobe PDF | View/Open |
Title: | Electronegativity and doping in Si1-xGex alloys |
Authors: | Kuganathan, N Chroneos, A Christopoulos, S-RG |
Item Type: | Journal Article |
Abstract: | Silicon germanium alloys are technologically important in microelectronics but also they are an important paradigm and model system to study the intricacies of the defect processes on random alloys. The key in semiconductors is that dopants and defects can tune their electronic properties and although their impact is well established in elemental semiconductors such as silicon they are not well characterized in random semiconductor alloys such as silicon germanium. In particular the impact of electronegativity of the local environment on the electronic properties of the dopant atom needs to be clarified. Here we employ density functional theory in conjunction with special quasirandom structures model to show that the Bader charge of the dopant atoms is strongly dependent upon the nearest neighbor environment. This in turn implies that the dopants will behave differently is silicon-rich and germanium-rich regions of the silicon germanium alloy. |
Issue Date: | 4-May-2020 |
Date of Acceptance: | 9-Apr-2020 |
URI: | http://hdl.handle.net/10044/1/79105 |
DOI: | 10.1038/s41598-020-64403-8 |
ISSN: | 2045-2322 |
Publisher: | Nature Publishing Group |
Journal / Book Title: | Scientific Reports |
Volume: | 10 |
Copyright Statement: | © 2020 The Author(s). This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. Te images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/. |
Publication Status: | Published |
Article Number: | 7459 |
Online Publication Date: | 2020-05-04 |
Appears in Collections: | Materials Faculty of Engineering |