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An overview of next-generation architectures for machine learning: roadmap, opportunities and challenges in the IoT era
File | Description | Size | Format | |
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1032_OutputPaper (3).pdf | Accepted version | 1.14 MB | Adobe PDF | View/Open |
Title: | An overview of next-generation architectures for machine learning: roadmap, opportunities and challenges in the IoT era |
Authors: | Shafique, M Theocharides, T Bouganis, C-S Hanif, MA Khalid, F Hafiz, R Rehman, S |
Item Type: | Conference Paper |
Abstract: | The number of connected Internet of Things (IoT) devices are expected to reach over 20 billion by 2020. These range from basic sensor nodes that log and report the data to the ones that are capable of processing the incoming information and taking an action accordingly. Machine learning, and in particular deep learning, is the de facto processing paradigm for intelligently processing these immense volumes of data. However, the resource inhibited environment of IoT devices, owing to their limited energy budget and low compute capabilities, render them a challenging platform for deployment of desired data analytics. This paper provides an overview of the current and emerging trends in designing highly efficient, reliable, secure and scalable machine learning architectures for such devices. The paper highlights the focal challenges and obstacles being faced by the community in achieving its desired goals. The paper further presents a roadmap that can help in addressing the highlighted challenges and thereby designing scalable, high-performance, and energy efficient architectures for performing machine learning on the edge. |
Issue Date: | 23-Apr-2018 |
Date of Acceptance: | 19-Mar-2018 |
URI: | http://hdl.handle.net/10044/1/63605 |
DOI: | https://dx.doi.org/10.23919/DATE.2018.8342120 |
ISBN: | 978-3-9819263-0-9 |
ISSN: | 1558-1101 |
Publisher: | IEEE |
Start Page: | 827 |
End Page: | 832 |
Journal / Book Title: | 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) |
Copyright Statement: | © 2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. |
Conference Name: | Design, Automation & Test in Europe Conference & Exhibition (DATE) |
Start Date: | 2018-03-19 |
Finish Date: | 2018-03-23 |
Conference Place: | Dresden, Germany |
Appears in Collections: | Electrical and Electronic Engineering |