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Deep vs shallow nature of oxygen vacancies and consequent n-type carrier concentrations in transparent conducting oxides
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prm_tco-ovac_18.pdf | Published version | 2.29 MB | Adobe PDF | View/Open |
Title: | Deep vs shallow nature of oxygen vacancies and consequent n-type carrier concentrations in transparent conducting oxides |
Authors: | Buckeridge, J Catlow, CRA Farrow, MR Logsdail, AJ Scanlon, DO Keal, TW Sherwood, P Woodley, SM Sokol, AA Walsh, A |
Item Type: | Journal Article |
Abstract: | The source of n-type conductivity in undoped transparent conducting oxides has been a topic of debate for several decades. The point defect of most interest in this respect is the oxygen vacancy, but there are many conflicting reports on the shallow versus deep nature of its related electronic states. Here, using a hybrid quantum mechanical/molecular mechanical embedded cluster approach, we have computed formation and ionization energies of oxygen vacancies in three representative transparent conducting oxides: In2O3,SnO2, and ZnO. We find that, in all three systems, oxygen vacancies form well-localized, compact donors. We demonstrate, however, that such compactness does not preclude the possibility of these states being shallow in nature, by considering the energetic balance between the vacancy binding electrons that are in localized orbitals or in effective-mass-like diffuse orbitals. Our results show that, thermodynamically, oxygen vacancies in bulk In2O3 introduce states above the conduction band minimum that contribute significantly to the observed conductivity properties of undoped samples. For ZnO and SnO2, the states are deep, and our calculated ionization energies agree well with thermochemical and optical experiments. Our computed equilibrium defect and carrier concentrations, however, demonstrate that these deep states may nevertheless lead to significant intrinsic n-type conductivity under reducing conditions at elevated temperatures. Our study indicates the importance of oxygen vacancies in relation to intrinsic carrier concentrations not only in In2O3, but also in SnO2 and ZnO. |
Issue Date: | 25-May-2018 |
Date of Acceptance: | 1-May-2018 |
URI: | http://hdl.handle.net/10044/1/60683 |
DOI: | https://dx.doi.org/10.1103/PhysRevMaterials.2.054604 |
ISSN: | 2475-9953 |
Publisher: | American Physical Society |
Journal / Book Title: | Physical Review Materials |
Volume: | 2 |
Issue: | 5 |
Copyright Statement: | Published by the American Physical Society under the terms of the Creative Commons Attribution 4.0 International license (https://creativecommons.org/licenses/by/4.0/). Further distribution of this work must maintain attribution to the author(s) and the published article's title, journal citation, and DOI. |
Sponsor/Funder: | The Royal Society |
Funder's Grant Number: | UF150657 |
Keywords: | Science & Technology Technology Materials Science, Multidisciplinary Materials Science LEVEL TRANSIENT SPECTROSCOPY INITIO MOLECULAR-DYNAMICS TOTAL-ENERGY CALCULATIONS NATIVE POINT-DEFECTS P-TYPE SEMICONDUCTOR ZNO SINGLE-CRYSTALS WAVE BASIS-SET ELECTRICAL-PROPERTIES ZINC-OXIDE THIN-FILMS |
Publication Status: | Published |
Article Number: | 054604 |
Online Publication Date: | 2018-05-25 |
Appears in Collections: | Materials Faculty of Engineering |