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Classification with Margin Constraints: A Unification with Applications to Optimization
File | Description | Size | Format | |
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OPT2015_paper_48(1).pdf | Published version | 213.36 kB | Unknown | View/Open |
Title: | Classification with Margin Constraints: A Unification with Applications to Optimization |
Authors: | Joulani, P Gyorgy, A Szepesvari, C |
Item Type: | Conference Paper |
Abstract: | This paper introduces Classification with Margin Constraints (CMC), a simple generalization of cost-sensitive classification that unifies several learning settings. In particular, we show that a CMC classifier can be used, out of the box, to solve regression, quantile estimation, and several anomaly detection formulations. On the one hand, our reductions to CMC are at the loss level: the optimization problem to solve under the equivalent CMC setting is exactly the same as the optimization problem under the original (e.g. regression) setting. On the other hand, due to the close relationship between CMC and standard binary classification, the ideas proposed for efficient optimization in binary classification naturally extend to CMC. As such, any improvement in CMC optimization immediately transfers to the domains reduced to CMC, without the need for new derivations or programs. To our knowledge, this unified view has been overlooked by the existing practice in the literature, where an optimization technique (such as SMO or PEGASOS) is first developed for binary classification and then extended to other problem domains on a case-by-case basis. We demonstrate the flexibility of CMC by reducing two recent anomaly detection and quantile learning methods to CMC. |
Issue Date: | 11-Dec-2015 |
Date of Acceptance: | 2-Nov-2015 |
URI: | http://hdl.handle.net/10044/1/40574 |
Copyright Statement: | © 2015 The Authors |
Conference Name: | 8th NIPS Workshop on Optimization for Machine Learning |
Publication Status: | Published |
Start Date: | 2015-12-11 |
Finish Date: | 2015-12-11 |
Conference Place: | Montreal, Quebec, Canada |
Open Access location: | http://opt-ml.org/oldopt/papers/OPT2015_paper_48.pdf |
Appears in Collections: | Electrical and Electronic Engineering Faculty of Engineering |