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Grain bridging locations of monolithic silicon carbide by means of focused ion beam milling technique
| File | Description | Size | Format | |
|---|---|---|---|---|
 Manuscript%20Final.docx | Accepted version | 2.22 MB | Microsoft Word | View/Open |
| Title: | Grain bridging locations of monolithic silicon carbide by means of focused ion beam milling technique |
| Authors: | Nasiri, NA Saiz, E Giuliani, F Vandeperre, LJ |
| Item Type: | Journal Article |
| Issue Date: | 14-Mar-2016 |
| Date of Acceptance: | 12-Mar-2016 |
| URI: | http://hdl.handle.net/10044/1/31112 |
| DOI: | http://dx.doi.org/10.1016/j.matlet.2016.03.061 |
| ISSN: | 1873-4979 |
| Publisher: | Elsevier |
| Start Page: | 214 |
| End Page: | 218 |
| Journal / Book Title: | Materials Letters |
| Volume: | 173 |
| Copyright Statement: | © 2016 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/). |
| Keywords: | Materials 09 Engineering 03 Chemical Sciences |
| Notes: | publisher: Elsevier articletitle: Grain bridging locations of monolithic silicon carbide by means of focused ion beam milling technique journaltitle: Materials Letters articlelink: http://dx.doi.org/10.1016/j.matlet.2016.03.061 content_type: article copyright: Copyright © 2016 The Authors. Published by Elsevier B.V. All rights reserved. |
| Publication Status: | Accepted |
| Appears in Collections: | Materials Faculty of Engineering |