144
IRUS TotalDownloads
Altmetric
Coexistence of Universal and Topological Anomalous Hall Effects in Metal CrO2 Thin Films in the Dirty Limit
File | Description | Size | Format | |
---|---|---|---|---|
Physical Review Letters_102_22_2009.pdf | Accepted version | 207.58 kB | Adobe PDF | View/Open |
Title: | Coexistence of Universal and Topological Anomalous Hall Effects in Metal CrO2 Thin Films in the Dirty Limit |
Authors: | Branford, WR Yates, KA Barkhoudarov, E Moore, JD Morrison, K Magnus, F Miyoshi, Y Sousa, PM Conde, O Silvestre, AJ Cohen, LF |
Item Type: | Journal Article |
Issue Date: | 5-Jun-2009 |
URI: | http://hdl.handle.net/10044/1/18746 |
DOI: | http://dx.doi.org/10.1103/PhysRevLett.102.227201 |
ISSN: | 0031-9007 |
Publisher: | AMER PHYSICAL SOC |
Journal / Book Title: | PHYSICAL REVIEW LETTERS |
Volume: | 102 |
Issue: | 22 |
Copyright Statement: | © 2009 The American Physical Society |
Publication Status: | Published |
Appears in Collections: | Experimental Solid State |