Yield modelling and yield enhancement for FPGAs using fault tolerance schemes

Title:	Yield modelling and yield enhancement for FPGAs using fault tolerance schemes
Authors:	Campregher,N. Cheung,P.Y.K. Constantinides,G.A. Vasilko,M.
Item Type:	Conference Paper
Content Version:	Published version
Issue Date:	2005
URI:	http://hdl.handle.net/10044/1/1125
Publisher Link:	http://dx.doi.org/10.1109/FPL.2005.1515756
ISBN:	0-7803-9362-7 9780780393622
Publisher:	IEEE
Presented At:	International Conference on Field Programmable Logic and Applications, 24 - 26 August 2005
Start Page:	409
End Page:	414
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Appears in Collections:	Circuits and Systems