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Atomic-scale mapping of impurities in partially reduced hollow TiO2 nanowires
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Atomic-Scale Mapping of Impurities in Partially Reduced Hollow TiO2 Nanowires.pdf | Published version | 2.01 MB | Adobe PDF | View/Open |
Title: | Atomic-scale mapping of impurities in partially reduced hollow TiO2 nanowires |
Authors: | Lim, J Kim, S-H Armengol, RA Kasian, O Choi, P-P Stephenson, LT Gault, B Scheu, C |
Item Type: | Journal Article |
Abstract: | The incorporation of impurities during the chemical synthesis of nanomaterials is usually uncontrolled and rarely reported because of the formidable challenge in measuring trace amounts of often light elements with sub-nanometer spatial resolution. And yet, these foreign elements (introduced by doping, for example) influence functional properties. We demonstrate how the hydrothermal growth and a partial reduction reaction on hollow TiO2 nanowires leads to the introduction of parts per millions of boron, sodium, and nitrogen. This doping explains the presence of oxygen vacancies and reduced Ti states at the surface, which enhance the functional properties of TiO2. Our results were obtained on model metal oxide nanomaterials and they shed light on a general process that leads to the uncontrolled incorporation of trace impurities in TiO2, thereby, having a strong effect on applications in energy-harvesting. |
Issue Date: | 27-Mar-2020 |
Date of Acceptance: | 1-Jan-2020 |
URI: | http://hdl.handle.net/10044/1/104269 |
DOI: | 10.1002/anie.201915709 |
ISSN: | 1433-7851 |
Publisher: | Wiley |
Start Page: | 5651 |
End Page: | 5655 |
Journal / Book Title: | Angewandte Chemie International Edition |
Volume: | 59 |
Issue: | 14 |
Copyright Statement: | © 2020 The Authors. Published by Wiley-VCH Verlag GmbH & Co. KGaA. This is an open access article under the terms of the Creative Commons Attribution License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited. |
Publication Status: | Published |
Online Publication Date: | 2020-01-10 |
Appears in Collections: | Materials Faculty of Engineering |
This item is licensed under a Creative Commons License