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Correlating atom probe tomography with x-ray and electron spectroscopies to understand microstructure-activity relationships in electrocatalysts
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Title: | Correlating atom probe tomography with x-ray and electron spectroscopies to understand microstructure-activity relationships in electrocatalysts |
Authors: | Gault, B Schweinar, K Zhang, S Lahn, L Scheu, C Kim, S-H Kasian, O |
Item Type: | Journal Article |
Abstract: | The search for a new energy paradigm with net-zero carbon emissions requires new technologies for energy generation and storage that are at the crossroad between engineering, chemistry, physics, surface, and materials sciences. To keep pushing the inherent boundaries of device performance and lifetime, we need to step away from a cook-and-look approach and aim to establish the scientific ground to guide the design of new materials. This requires strong efforts in establishing bridges between microscopy and spectroscopy techniques, across multiple scales. Here, we discuss how the complementarities of x-ray- and electron-based spectroscopies and atom probe tomography can be exploited in the study of surfaces and subsurfaces to understand structure–property relationships in electrocatalysts. |
Issue Date: | Jul-2022 |
Date of Acceptance: | 29-Jun-2022 |
URI: | http://hdl.handle.net/10044/1/104211 |
DOI: | 10.1557/s43577-022-00373-8 |
ISSN: | 0883-7694 |
Publisher: | Materials Research Society |
Start Page: | 718 |
End Page: | 726 |
Journal / Book Title: | Materials Research Society (MRS) Bulletin |
Volume: | 47 |
Issue: | 7 |
Copyright Statement: | Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article's Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article's Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/. |
Publication Status: | Published |
Online Publication Date: | 2022-08-24 |
Appears in Collections: | Materials |
This item is licensed under a Creative Commons License