New generations of photovoltaics (PV) have demonstrated a significant cost-reduction
with respect to c-Si wafer-based modules. Though second (thin-film) and third generation
PV (high-intensity, low-cost) are already in the PV market, the preparation of standard
procedures for their characterization is still ongoing. This work was developed by the
author in order to extend some of the existing characterization techniques to a set of
three different emerging technologies: multi-junction thin-film modules, concentrator PV
cells and luminescent solar concentrators.
An original method for the spectral response measurement of large area thin-film multijunction
modules is presented in the first part: the method is validated with several
examples. A basic theoretical approach is also presented to propose innovative explanations
of measurement artefacts that are observed in the literature.
In the second part of the thesis, the setup, characterization and classification of a high
intensity pulsed solar simulator for concentrator PV cells is illustrated. A new procedure
for the preparation of a set of filtered reference cells for the irradiance detection at high
intensities is also presented, providing an original tool for the verification of the linearity
of these devices towards irradiance, which is usually assumed in the literature.
In the third part the performance characterization of high-efficiency luminescent solar
concentrators is presented: a simple ray-tracing model and its experimental validation,
the impact of backside diffusive reflector on the performance of this kind of devices are
mainly highlighted.
The work was developed in support of the activities of the European Solar Test Installation
laboratory of the European Commission, a centre of reference for PV testing.