Characterisation of defects in waveguides formed by electron irradiation of silica-on-silicon

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Title: Characterisation of defects in waveguides formed by electron irradiation of silica-on-silicon
Author(s): Spaargaren,S.M.R.
Syms,R.R.A.
Item Type: Journal Article
Content Version: Published version
Publication Date: 1-Apr-2000
Citation: IEEE Lightwave Technology Vol.( 18 ) No.( 4 ) pp 555 - 561
URI: http://hdl.handle.net/10044/1/981
Publisher Link: http://dx.doi.org/10.1109/50.838130
ISSN: 0733-8724
Start Page: 555
End Page: 561
Copyright Statement: © 2000 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
Volume: 18
Appears in Collections:Optical and Semiconductor Devices



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