Passivation of oxygen and light induced degradation by the PCBM electron transport layer in planar perovskite solar cells

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Title: Passivation of oxygen and light induced degradation by the PCBM electron transport layer in planar perovskite solar cells
Author(s): Lin, C
Pont, S
Kim, J
Du, T
Xu, S
Li, X
Bryant, D
McLachlan, MA
Durrant, J
Item Type: Journal Article
Abstract: Herein, we investigate the causes of a 20 fold improved stability of inverted, planar structure (ITO/PTAA/CH3NH3PbI3/PCBM/BCP/Cu) compared to conventional structure devices (FTO/compact-TiO2/meso-TiO2/CH3NH3PbI3/spiro-OMeTAD/Au) under oxygen and light stress. The PCBM layer is shown to function as an oxygen diffusion barrier and passivation layer against superoxide mediated degradation. The passivation properties of the PCBM layer are shown to depend on the electron affinity of fullerene acceptor, attributed to low LUMO level of PCBM energetically inhibiting superoxide generation. We also find the planar structure devices shows slower lateral oxygen diffusion rates than mesoporous scaffold devices, with these slower diffusion rates (days per 100 μm) also being a key factor in enhancing stability. Faster degradation is observed under voltage cycling, attributed to oxygen diffusion kinetics being ion motion dependent. We conclude by discussing the implications of these results for the design of perovskite solar cells with improved resistance to oxygen and light induced degradation.
Date of Acceptance: 23-Mar-2018
URI: http://hdl.handle.net/10044/1/58487
ISSN: 2398-4902
Publisher: Royal Society of Chemistry
Journal / Book Title: Sustainable Energy and Fuels
Copyright Statement: This paper is embargoed until publication. Once published it will be available fully open access.
Sponsor/Funder: EPSRC
Funder's Grant Number: EP/L016702/1
Publication Status: Accepted
Embargo Date: publication subject to indefinite embargo
Appears in Collections:Faculty of Engineering
Materials
Faculty of Natural Sciences



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