Revealing structure and electronic properties at organic interfaces using TEM

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Title: Revealing structure and electronic properties at organic interfaces using TEM
Author(s): Gilchrist, JB
Heutz, S
McComb, DW
Item Type: Journal Article
Abstract: Molecules and atoms at material interfaces have properties that are distinct from those found in the bulk. Distinguishing the interfacial species from the bulk species is the inherent difficulty of interfacial analysis. For organic photovoltaic devices, the interface between the donor and acceptor materials is the location for exciton dissociation. Dissociation is thought to occur via a complex route effected by microstructure and the electronic energy levels. The scale of these devices and the soft nature of these materials create an additional level of difficulty for identification and analysis at these interfaces. The transmission electron microscope (TEM) and the spectroscopic techniques it incorporates can allow the properties of the donor-acceptor interfaces to be revealed. Cross-sectional sample preparation, using modern focused ion beam instruments, enables these buried interfaces to be uncovered with minimal damage for high resolution analysis. This powerful instrument combination has the ability to draw conclusions about interface morphology, structure and electronic properties of organic donor-acceptor interfaces at the molecular scale. Recent publications have demonstrated these abilities, and this article aims to summarise some of that work and provide scope for the future.
Publication Date: 1-Apr-2017
Date of Acceptance: 7-Jan-2017
URI: http://hdl.handle.net/10044/1/50531
DOI: https://dx.doi.org/10.1016/j.cossms.2017.01.002
ISSN: 1359-0286
Publisher: Elsevier
Start Page: 68
End Page: 76
Journal / Book Title: Current Opinion in Solid State and Materials Science
Volume: 21
Issue: 2
Copyright Statement: © 2017, Elsevier. Licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International http://creativecommons.org/licenses/by-nc-nd/4.0/
Sponsor/Funder: Engineering & Physical Science Research Council (EPSRC)
Engineering & Physical Science Research Council (EPSRC)
Funder's Grant Number: EP/F039948/1
EP/F04139X/1
Keywords: Science & Technology
Technology
Physical Sciences
Materials Science, Multidisciplinary
Physics, Applied
Physics, Condensed Matter
Materials Science
Physics
Interfaces
Cross-sections
Organic
TEM
EDX
EFTEM
EELS
HETEROJUNCTION SOLAR-CELLS
COPPER-PHTHALOCYANINE
RADIATION-DAMAGE
THIN-FILMS
MOLECULAR-ORIENTATION
CRYSTAL DEFECTS
MICROSCOPY
SPECTROSCOPY
ULTRAMICROTOMY
PHOTOVOLTAICS
Science & Technology
Technology
Physical Sciences
Materials Science, Multidisciplinary
Physics, Applied
Physics, Condensed Matter
Materials Science
Physics
Interfaces
Cross-sections
Organic
TEM
EDX
EFTEM
EELS
HETEROJUNCTION SOLAR-CELLS
COPPER-PHTHALOCYANINE
RADIATION-DAMAGE
THIN-FILMS
MOLECULAR-ORIENTATION
CRYSTAL DEFECTS
MICROSCOPY
SPECTROSCOPY
ULTRAMICROTOMY
PHOTOVOLTAICS
0912 Materials Engineering
Materials
Publication Status: Published
Appears in Collections:Faculty of Engineering
Materials
Faculty of Natural Sciences



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