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Measurements of permittivity, dieletric loss tangent, and resistivity of float-zone silicon at microwave frequencies

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Title: Measurements of permittivity, dieletric loss tangent, and resistivity of float-zone silicon at microwave frequencies
Author(s): Krupka, J
Breeze, J
Centeno, A
Alford, N
Claussen, T
Jensen, L
Item Type: Journal Article
Content Version: Published version
Publication Date: 1-Nov-2006
Citation: IEEE T MICROW THEORY Vol.( 54 ) No.( 11 ) pp 3995 - 4001
URI: http://hdl.handle.net/10044/1/276
Publisher Link: http://dx.doi.org/10.1109/TMTT.2006.883655
DOI: 10.1109/TMTT.2006.883655
ISSN: 0018-9480
Start Page: 3995
End Page: 4001
Copyright Statement: ©2006 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
Volume: 54
Appears in Collections:Materials



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