A fitted finite element method for the numerical approximation of void electro-stress migration

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Title: A fitted finite element method for the numerical approximation of void electro-stress migration
Author(s): Nurnberg, R
Sacconi, A
Item Type: Journal Article
Publication Date: 25-Sep-2015
Date of Acceptance: 7-Sep-2015
URI: http://hdl.handle.net/10044/1/26168
DOI: https://dx.doi.org/10.1016/j.apnum.2015.08.008
ISSN: 1873-5460
Publisher: Elsevier
Start Page: 204
End Page: 217
Journal / Book Title: Applied Numerical Mathematics
Volume: 104
Copyright Statement: © 2015, Elsevier. Licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International http://creativecommons.org/licenses/by-nc-nd/4.0/
Keywords: Science & Technology
Physical Sciences
Mathematics, Applied
Mathematics
Fitted
Finite element method
Electro-stress migration
PHASE FIELD MODEL
GENERIC GRID INTERFACE
SURFACE-DIFFUSION
ELECTROMIGRATION
COMPUTATION
MESHES
EQUATIONS
EVOLUTION
PARALLEL
DESIGN
Numerical & Computational Mathematics
0102 Applied Mathematics
0103 Numerical And Computational Mathematics
0802 Computation Theory And Mathematics
Publication Status: Published
Appears in Collections:Mathematics
Applied Mathematics and Mathematical Physics
Faculty of Natural Sciences



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