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Using process topology in plant-wide control loop performance assessment

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Title: Using process topology in plant-wide control loop performance assessment
Authors: Yim, SY
Ananthakumar, HG
Benabbas, L
Horch, A
Drathb, R
Thornhill, NF
Item Type: Journal Article
Issue Date: 1-Dec-2006
URI: http://hdl.handle.net/10044/1/14367
DOI: http://dx.doi.org/10.1016/j.compchemeng.2006.05.004
ISSN: 0098-1354
Publisher: PERGAMON-ELSEVIER SCIENCE LTD
Start Page: 86
End Page: 99
Journal / Book Title: COMPUTERS & CHEMICAL ENGINEERING
Volume: 31
Issue: 2
Copyright Statement: © 2006 Elsevier Ltd. All rights reserved.NOTICE: this is the author’s version of a work that was accepted for publication in Computers and Chemical Engineering. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Computing and Chemical Engineering, Vol. 31, Issue 2, (2006) DOI 10.1016/j.compchemeng.2006.05.004
Publication Status: Published
Appears in Collections:Chemical Engineering



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