Timing Measurement Platform for Arbitrary Black-Box Circuits Based on Transition Probability

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Title: Timing Measurement Platform for Arbitrary Black-Box Circuits Based on Transition Probability
Author(s): Wong, JSJ
Cheung, PYK
Item Type: Journal Article
Publication Date: 1-Dec-2013
URI: http://hdl.handle.net/10044/1/11166
DOI: http://dx.doi.org/10.1109/TVLSI.2012.2230280
ISSN: 1063-8210
Start Page: 1
End Page: 1
Journal / Book Title: IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Copyright Statement: © 2013 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Appears in Collections:Electrical and Electronic Engineering



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