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Issue DateTitleAuthor(s)
20-Apr-2011ACCOUNTING FOR CALIBRATION UNCERTAINTIES IN X-RAY ANALYSIS: EFFECTIVE AREAS IN SPECTRAL FITTINGLee, H; Kashyap, VL; van Dyk, DA; Connors, A; Drake, JJ, et al
20-May-2002Statistics, handle with care: Detecting multiple model components with the likelihood ratio testProtassov, R; van Dyk, DA; Connors, A; Kashyap, VL; Siemiginowska, A
10-Aug-2010ON COMPUTING UPPER LIMITS TO SOURCE INTENSITIESKashyap, VL; van Dyk, DA; Connors, A; Freeman, PE; Siemiginowska, A, et al