A detailed investigation of single-photon laser enabled Auger decay in neon

Abstract

Single-photon Laser Enabled Auger Decay (spLEAD) is an electronic de-excitation process which was recently predicted and observed in Ne. We have investigated it using bichromatic phase-locked Free Electron Laser radiation and extensive angle-resolved photoelectron measurements, supported by a detailed theoretical model. We first used separately the fundamental wavelength resonant with the Ne+ 2s-2p transition, 46.17 nm, and its second harmonic, 23.08 nm, then their phase-locked bichromatic combination. In the latter case the phase difference between the two wavelengths was scanned, and interference effects were observed, confirming that the spLEAD process was occurring. The detailed theoretical model we developed qualitatively predicts all observations: branching ratios between the final Auger states, their amplitudes of oscillation as a function of phase, the phase lag between the oscillations of different final states, and partial cancellation of the oscillations under certain conditions.