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Direct in-situ single-shot measurements of the absolute carrier-envelope phases of ultrashort pulses

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Title: Direct in-situ single-shot measurements of the absolute carrier-envelope phases of ultrashort pulses
Authors: Debrah, DA
Stewart, GA
Basnayake, G
Tisch, JWG
Lee, SK
Li, W
Item Type: Journal Article
Abstract: Many important physical processes such as nonlinear optics and coherent control are highly sensitive to the absolute carrier-envelope phase (CEP) of driving ultrashort laser pulses. This makes the measurement of CEP immensely important in relevant fields. Even though relative CEPs can be measured with a few existing technologies, the estimate of the absolute CEP is not straightforward and always requires theoretical inputs. Here, we demonstrate a novel in-situ technique based on angular streaking that can achieve such a goal without complicated calibration procedures. Single-shot measurements of the absolute CEP have been achieved with an estimated precision of 0.19 radians.
Issue Date: 15-Jul-2019
Date of Acceptance: 20-Jun-2019
URI: http://hdl.handle.net/10044/1/72322
DOI: https://doi.org/10.1364/OL.44.003582
ISSN: 0146-9592
Publisher: Optical Society of America
Start Page: 3582
End Page: 3585
Journal / Book Title: Optics Letters
Volume: 44
Issue: 14
Copyright Statement: © 2019 Optical Society of America. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modifications of the content of this paper are prohibited.
Keywords: Science & Technology
Physical Sciences
Optics
IONIZATION
Science & Technology
Physical Sciences
Optics
IONIZATION
0205 Optical Physics
0206 Quantum Physics
0906 Electrical and Electronic Engineering
Optics
Publication Status: Published
Online Publication Date: 2019-07-15
Appears in Collections:Quantum Optics and Laser Science
Physics