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An Integrated ISFETs Instrumentation System in Standard CMOS Technology

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Title: An Integrated ISFETs Instrumentation System in Standard CMOS Technology
Authors: Chan, WP
Premanode, B
Toumazou, C
Item Type: Journal Article
Content Version: Published version
Issue Date: 1-Sep-2010
Citation: IEEE Journal of Solid-State Circuits Vol.( 45 ) No.( 9 ) pp 1923 - 1934
URI: http://hdl.handle.net/10044/1/6077
Publisher Link: http://dx.doi.org/10.1109/JSSC.2010.2053863
DOI: 10.1109/JSSC.2010.2053863
ISSN: 0018-9200
Start Page: 1923
End Page: 1934
Copyright Statement: © 2010 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Volume: 45
Appears in Collections:Circuits and Systems