Area-driven partial reconfiguration for SEU mitigation on SRAM-based FPGAs

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Title: Area-driven partial reconfiguration for SEU mitigation on SRAM-based FPGAs
Authors: Vavouras, M
Bouganis, C-S
Item Type: Conference Paper
Abstract: This paper presents an area-driven Field-Programmable Gate Array (FPGA) scrubbing technique based on partial reconfiguration for Single Event Upset (SEU) mitigation. The proposed method is compared with existing techniques such as blind and on-demand scrubbing on a novel SEU mitigation framework implemented on the ZYNQ platform, supporting various SEU and scrubbing rates. A design space exploration on the availability versus data transfers from a Double Data Rate Type 3 (DDR3) memory, shows that our approach outperforms blind scrubbing for a range of availability values when a second order polynomial IP is targeted. A comparison to an existing on-demand scrubbing technique based on Dual Modular Redundancy (DMR) shows that our approach saves up to 46% area for the same case study.
Editors: Athanas, P
Cumplido, R
Feregrino, C
Sass, R
Issue Date: 16-Feb-2017
Date of Acceptance: 30-Nov-2016
URI: http://hdl.handle.net/10044/1/54274
DOI: https://dx.doi.org/10.1109/ReConFig.2016.7857154
ISSN: 2325-6532
Publisher: IEEE
Journal / Book Title: ReConFigurable Computing and FPGAs (ReConFig), 2016 International Conference on
Copyright Statement: © 2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Sponsor/Funder: Commission of the European Communities
Funder's Grant Number: 287611
Conference Name: International Conference on Reconfigurable Computing and FPGAs (ReConFig)
Keywords: Science & Technology
Technology
Computer Science, Hardware & Architecture
Computer Science
Publication Status: Published
Start Date: 2016-11-30
Finish Date: 2016-12-02
Conference Place: Cancun, Mexico
Appears in Collections:Electrical and Electronic Engineering



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