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Nanocrystalline copper films are never flat

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Title: Nanocrystalline copper films are never flat
Authors: Zhang, X
Han, J
Plombon, JJ
Sutton, AP
Srolovitz, DJ
Boland, JJ
Item Type: Journal Article
Abstract: We used scanning tunneling microscopy to study low-angle grain boundaries at the surface of nearly planar copper nanocrystalline (111) films. The presence of grain boundaries and their emergence at the film surface create valleys composed of dissociated edge dislocations and ridges where partial dislocations have recombined. Geometric analysis and simulations indicated that valleys and ridges were created by an out-of-plane grain rotation driven by reduction of grain boundary energy. These results suggest that in general, it is impossible to form flat two-dimensional nanocrystalline films of copper and other metals exhibiting small stacking fault energies and/or large elastic anisotropy, which induce a large anisotropy in the dislocation-line energy.
Issue Date: 28-Jul-2017
Date of Acceptance: 21-Jun-2017
URI: http://hdl.handle.net/10044/1/49648
DOI: https://dx.doi.org/10.1126/science.aan4797
ISSN: 1095-9203
Publisher: American Association for the Advancement of Science
Start Page: 397
End Page: 400
Journal / Book Title: Science
Volume: 357
Issue: 6349
Copyright Statement: © 2017 The Authors, some rights reserved; exclusive licensee American Association for the Advancement of Science. No claim to original U.S. Government Works http://www.sciencemag.org/about/science-licenses-journal-article-reuse
Keywords: MD Multidisciplinary
General Science & Technology
Publication Status: Published
Appears in Collections:Condensed Matter Theory
Physics
Faculty of Natural Sciences