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X-ray diffraction and extended X-ray absorption fine structure study of epitaxial mixed ternary bixbyite PrxY2-xO3 (x = 0-2) films on Si (111)

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Title: X-ray diffraction and extended X-ray absorption fine structure study of epitaxial mixed ternary bixbyite PrxY2-xO3 (x = 0-2) films on Si (111)
Authors: Niu, G
Zoellner, MH
Zaumseil, P
Pouliopoulos, A
D'Acapito, F
Schroeder, T
Boscherini, F
Item Type: Journal Article
Abstract: Ternary single crystalline bixbyite PrxY2−xO3 films over the full stoichiometry range (x = 0–2) have been epitaxially grown on Si (111) with tailored electronic and crystallographic structure. In this work, we present a detailed study of their local atomic environment by extended X-ray absorption fine structure at both Y K and Pr LIII edges, in combination with complementary high resolution x-ray diffraction measurements. The local structure exhibits systematic variations as a function of the film composition. The cation coordination in the second and third coordination shells changes with composition and is equal to the average concentration, implying that the PrxY2−xO3 films are indeed fully mixed and have a local bixbyite structure with random atomic-scale ordering. A clear deviation from the virtual crystal approximation for the cation-oxygen bond lengths is detected. This demonstrates that the observed Vegard's law for the lattice variation as a function of composition is based microscopically on a more complex scheme related to local structural distortions which accommodate the different cation–oxygen bond lengths.
Issue Date: 23-Jan-2013
Date of Acceptance: 7-Jan-2013
URI: http://hdl.handle.net/10044/1/41162
DOI: http://dx.doi.org/10.1063/1.4788982
ISSN: 0021-8979
Publisher: American Institute of Physics
Journal / Book Title: Journal of Applied Physics
Volume: 113
Issue: 4
Copyright Statement: © 2013 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. The following article appeared in Journal of Applied Physics and may be found at http://dx.doi.org/10.1063/1.4788982.
Keywords: Applied Physics
Mathematical Sciences
Physical Sciences
Engineering
Publication Status: Published
Article Number: 043504
Appears in Collections:Bioengineering
Faculty of Engineering