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Measurements of permittivity, dieletric loss tangent, and resistivity of float-zone silicon at microwave frequencies
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Title: | Measurements of permittivity, dieletric loss tangent, and resistivity of float-zone silicon at microwave frequencies |
Authors: | Krupka, J Breeze, J Centeno, A Alford, N Claussen, T Jensen, L |
Item Type: | Journal Article |
Content Version: | Published version |
Issue Date: | 1-Nov-2006 |
Citation: | IEEE T MICROW THEORY Vol.( 54 ) No.( 11 ) pp 3995 - 4001 |
URI: | http://hdl.handle.net/10044/1/276 |
Publisher Link: | http://dx.doi.org/10.1109/TMTT.2006.883655 |
DOI: | 10.1109/TMTT.2006.883655 |
ISSN: | 0018-9480 |
Start Page: | 3995 |
End Page: | 4001 |
Copyright Statement: | ©2006 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. |
Volume: | 54 |
Appears in Collections: | Materials |