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Data for "The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements"
Author(s)
Tong, Vivian
Jiang, Jun
Wilkinson, Angus
Britton, Ben
Type
Dataset
Abstract
The zip contains three subfolders:
Fig4 Interaction volume measurement
Fig14 Error approaching gb
Fig16 GrainBoundaryProbability
Date Issued
2015-04-24
Citation
2015
URI
DOI
Copyright Statement
http://creativecommons.org/licenses/by-sa/4.0/legalcode
Subjects
pattern overlap
cross-correlation
grain boundary
high-resolution EBSD
electron microscopy
material science
diffraction
electron backscatter diffraction