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  4. Understanding metric-related pitfalls in image analysis validation
 
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Understanding metric-related pitfalls in image analysis validation
File(s)
2302.01790v3.pdf (31.61 MB)
Preprint
Author(s)
Reinke, Annika
Tizabi, Minu D
Baumgartner, Michael
Eisenmann, Matthias
Heckmann-Nötzel, Doreen
more
Type
preprint
Date Issued
2023-09-25
Citation
arXiv, 2023
URI
http://hdl.handle.net/10044/1/109010
URL
https://arxiv.org/abs/2302.01790
DOI
https://www.dx.doi.org/10.48550/arXiv.2302.01790
Journal / Book Title
arXiv
Copyright Statement
Copyright © 2023 The Author(s). This work is licensed under a Creative Commons Attribution 4.0 International License (https://creativecommons.org/licenses/by/4.0/).
License URL
https://creativecommons.org/licenses/by/4.0/
Identifier
https://arxiv.org/abs/2302.01790
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