Diffusion and dopant activation in germanium: insights from recent experimental and theoretical results
File(s)applsci-09-02454.pdf (3.05 MB)
Published version
Author(s)
Kuganathan, Navaratnarajah
Sgourou, EN
Panayiotatos, Y
Chroneos, Alexander
Type
Journal Article
Abstract
Germanium is an important mainstream material for many nanoelectronic and sensor applications. The understanding of diffusion at an atomic level is important for fundamental and technological reasons. In the present review, we focus on the description of recent studies concerning n-type dopants, isovalent atoms, p-type dopants, and metallic and oxygen diffusion in germanium. Defect engineering strategies considered by the community over the past decade are discussed in view of their potential application to other systems.
Date Issued
2019-06-15
Date Acceptance
2019-06-12
Citation
Applied Sciences, 2019, 9 (12), pp.1-14
ISSN
2076-3417
Publisher
MDPI AG
Start Page
1
End Page
14
Journal / Book Title
Applied Sciences
Volume
9
Issue
12
Copyright Statement
© 2019 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access
article distributed under the terms and conditions of the Creative Commons Attribution
(CC BY) license (http://creativecommons.org/licenses/by/4.0/).
article distributed under the terms and conditions of the Creative Commons Attribution
(CC BY) license (http://creativecommons.org/licenses/by/4.0/).
Identifier
https://www.mdpi.com/2076-3417/9/12/2454
Publication Status
Published
Date Publish Online
2019-06-15