Taming Coverage Criteria Heterogeneity with LTest
File(s) icst17b-marcozzi.pdf (286.79 KB)
Accepted version
Author(s)
Marcozzi, Michael
Bardin, Sebastien
Delahaye, Mickael
Kosmatov, Nikolai
Prevosto, Virgile
Type
Conference Paper
Abstract
Automated white-box testing is a major issue in software engineering. In previous work, we introduced LTest, a generic and integrated toolkit for automated white-box testing of C programs. LTest supports a broad class of coverage criteria in a unified way (through the label specification mechanism) and covers most major parts of the testing process – including coverage measurement, test generation and detection of infeasible test objectives. However, the original version of LTest was unable to handle several major classes of coverage criteria, such as MCDC or dataflow criteria. Moreover, its practical applicability remained barely assessed. In this work, we present a significantly extended version of LTest that supports almost all existing testing criteria, including MCDC and some software security properties, through a native support of recently proposed hyperlabels. We also provide a more realistic view on the practical applicability of the extended tool, with experiments assessing its efficiency and scalability on real-world programs.
Date Issued
2017-05-18
Date Acceptance
2017-01-10
Citation
2017 10TH IEEE INTERNATIONAL CONFERENCE ON SOFTWARE TESTING, VERIFICATION AND VALIDATION (ICST), 2017, pp.500-507
ISSN
2381-2834
Publisher
IEEE
Start Page
500
End Page
507
Journal / Book Title
2017 10TH IEEE INTERNATIONAL CONFERENCE ON SOFTWARE TESTING, VERIFICATION AND VALIDATION (ICST)
Copyright Statement
© 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Source
10th IEEE International Conference on Software Testing, Verification and Validation (ICSTW)
Subjects
Science & Technology
Technology
Computer Science, Software Engineering
Computer Science, Theory & Methods
Engineering, Electrical & Electronic
Computer Science
Engineering
Publication Status
Published
Start Date
2017-03-13
Finish Date
2017-03-17
Coverage Spatial
Tokyo, JAPAN
