Nanostructured 2D cellular materials in silicon by sidewall transfer lithography NEMS
File(s)revised paper BWtext.pdf (5.72 MB)
Accepted version
Author(s)
Syms, RRA
Liu, D
Ahmad, MM
Type
Journal Article
Abstract
Sidewall transfer lithography (STL) is demonstrated as a method for parallel fabrication of 2D nanostructured cellular solids in single-crystal silicon. The linear mechanical properties of four lattices (perfect and defected diamond; singly and doubly periodic honeycomb) with low effective Young's moduli and effective Poisson's ratio ranging from positive to negative are modelled using analytic theory and the matrix stiffness method with an emphasis on boundary effects. The lattices are fabricated with a minimum feature size of 100 nm and an aspect ratio of 40:1 using single- and double-level STL and deep reactive ion etching of bonded silicon-on-insulator. Nanoelectromechanical systems (NEMS) containing cellular materials are used to demonstrate stretching, bending and brittle fracture. Predicted edge effects are observed, theoretical values of Poisson's ratio are verified and failure patterns are described.
Date Issued
2017-06-02
Date Acceptance
2017-05-05
Citation
Journal of Micromechanics and Microengineering, 2017, 27 (7)
ISSN
0960-1317
Publisher
IOP Publishing
Journal / Book Title
Journal of Micromechanics and Microengineering
Volume
27
Issue
7
Copyright Statement
© 2017 IOP Publishing Ltd. This is an author-created, un-copyedited version of an article accepted for publication in Journal of Micromechanics and Microengineering. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The definitive publisher authenticated version is available online at https://dx.doi.org/10.1088/1361-6439/aa7167
Subjects
09 Engineering
10 Technology
Nanoscience & Nanotechnology
Publication Status
Published
Article Number
075003