Charge injection at metal/polymer interfaces is a critical process in many technological devices, including high voltage capacitors and cables in which polyolefin materials, such as polyethylene (PE) and polypropylene (PP), are often used as insulation materials. We use simulations based on density-functional theory to study charge injection at aluminum/PE and aluminum/PP interfaces. Specifically, we investigate the influence of incorporating a variety of polar chemical impurities at the PE and PP chain ends on electron and hole injection barriers. Crucially, we account for the effect of thermal disorder by considering ensembles of thousands of interface structures obtained from ab initio molecular dynamics trajectories at 373 K. We show that the mean injection barrier can change by up to 1.1 eV for Al/PE and 0.6 eV for Al/PP, as compared to the pristine case, depending on which chemical impurity is introduced. We also show that the spread of injection barriers from thermal fluctuations also depends strongly on the chemistry of the impurity. The observed trends can be understood with a simple model based on thermal fluctuations of the dipole moment density associated with the chemical impurity at the interface. We further verify this model by considering larger interface models with lower impurity densities. Our results demonstrate that small chemical modifications, which may arise from oxidation, for example, have a significant influence on charge injection barriers in metal/polyolefin interfaces.