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  5. Short range pipe guided wave testing using SH0 plane wave imaging for improved quantification accuracy
 
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Short range pipe guided wave testing using SH0 plane wave imaging for improved quantification accuracy
File(s)
sensors-22-02973-v2.pdf (8.46 MB)
Published version
Author(s)
Szlaszynski, Filip
Lowe, Michael JS
Huthwaite, Peter
Type
Journal Article
Abstract
Detection and criticality assessment of defects appearing in inaccessible locations in pipelines pose a great challenge for many industries. Inspection methods which allow for remote defect detection and accurate characterisation are needed. Guided wave testing (GWT) is capable of screening large lengths of pipes from a single device position, however it provides very limited individual feature characterisation. This paper adapts Plane Wave Imaging (PWI) to pipe GWT to improve defect characterization for inspection in nearby locations such as a few metres from the transducers. PWI performance is evaluated using finite element (FE) and experimental studies, and it is compared to other popular synthetic focusing imaging techniques. The study is concerned with part-circumferential part-depth planar cracks. It is shown that PWI achieves superior resolution compared to the common source method (CSM) and comparable resolution to the total focusing method (TFM). The techniques involving plane wave acquisition (PWI and CSM) are found to substantially outperform methods based on full matrix capture (FMC) in terms of signal-to-noise ratio (SNR). Therefore, it is concluded that PWI which achieves good resolution and high SNR is a more attractive choice for pipe GWT, compared to other considered techniques. Subsequently, a novel PWI transduction setup is proposed, and it is shown to suppresses the transmission of unwanted S0 mode, which further improves SNR of PWI.
Date Issued
2022-04-13
Date Acceptance
2022-04-11
Citation
Sensors, 2022, 22 (8), pp.1-23
URI
http://hdl.handle.net/10044/1/106261
URL
https://www.mdpi.com/1424-8220/22/8/2973
DOI
https://www.dx.doi.org/10.3390/s22082973
ISSN
1424-8220
Publisher
MDPI
Start Page
1
End Page
23
Journal / Book Title
Sensors
Volume
22
Issue
8
Copyright Statement
© 2022 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
License URL
Attribution 4.0 International
Identifier
https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000785455400001&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=a2bf6146997ec60c407a63945d4e92bb
Subjects
ARRAY DATA
Chemistry
Chemistry, Analytical
defect sizing
Engineering
Engineering, Electrical & Electronic
FULL-MATRIX
guided wave testing
Instruments & Instrumentation
non-destructive testing
NOTCHES
part-circumferential part-depth cracks
Physical Sciences
plane wave imaging
REFLECTION
Science & Technology
SH0 mode
synthetic focusing imaging
Technology
Publication Status
Published
Article Number
2973
Date Publish Online
2022-04-13
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