Direct imaging of correlated defect nanodomains in a metal-organic framework
File(s)
Author(s)
Type
Journal Article
Abstract
Defect engineering can enhance key properties of metal–organic frameworks (MOFs). Tailoring the distribution of defects, for example in correlated nanodomains, requires characterization across length scales. However, a critical nanoscale characterization gap has emerged between the bulk diffraction techniques used to detect defect nanodomains and the subnanometer imaging used to observe individual defects. Here, we demonstrate that the emerging technique of scanning electron diffraction (SED) can bridge this gap uniquely enabling both nanoscale crystallographic analysis and the low-dose formation of multiple diffraction contrast images for defect analysis in MOFs. We directly image defect nanodomains in the MOF UiO-66(Hf) over an area of ca. 1000 nm and with a spatial resolution ca. 5 nm to reveal domain morphology and distribution. Based on these observations, we suggest possible crystal growth processes underpinning synthetic control of defect nanodomains. We also identify likely dislocations and small angle grain boundaries, illustrating that SED could be a key technique in developing the potential for engineering the distribution of defects, or “microstructure”, in functional MOF design.
Date Issued
2020-07-29
Date Acceptance
2020-07-01
Citation
Journal of the American Chemical Society, 2020, 142 (30), pp.13081-13089
ISSN
0002-7863
Publisher
American Chemical Society
Start Page
13081
End Page
13089
Journal / Book Title
Journal of the American Chemical Society
Volume
142
Issue
30
Copyright Statement
© 2020 American Chemical Society. This publication is licensed under CC-BY.
License URL
Identifier
https://www.ncbi.nlm.nih.gov/pubmed/32627544
Subjects
Chemistry
Chemistry, Multidisciplinary
NANO
Physical Sciences
Science & Technology
TRANSMISSION ELECTRON-MICROSCOPY
UIO-66
Publication Status
Published
Coverage Spatial
United States
Date Publish Online
2020-07-04