Microscopic origins of electron and hole stability in ZnO
File(s)1102.0400v1.pdf (219.93 KB)
Accepted version
Author(s)
Catlow, CRA
Sokol, AA
Walsh, A
Type
Journal Article
Date Issued
2011-01-01
ISSN
1359-7345
Publisher
ROYAL SOC CHEMISTRY
Start Page
3386
End Page
3388
Journal / Book Title
CHEMICAL COMMUNICATIONS
Volume
47
Issue
12
Copyright Statement
© The Royal Society of Chemistry 2011
Identifier
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000288085600009&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=1ba7043ffcc86c417c072aa74d649202
Subjects
Science & Technology
Physical Sciences
Chemistry, Multidisciplinary
Chemistry
THIN-FILMS
ZINC-OXIDE
N-TYPE
SEMICONDUCTORS
CRYSTALS
HYDROGEN
DEFECTS
cond-mat.mtrl-sci
03 Chemical Sciences
Organic Chemistry
Publication Status
Published