TrueEBSD: Correcting spatial distortions in electron backscatter diffraction maps
File(s)
Accepted version
Author(s)
Tong, Vivian S
Ben Britton, T
Type
Journal Article
Abstract
Electron backscatter diffraction (EBSD) in the scanning electron microscope is routinely used for microstructural characterisation of polycrystalline materials. Maps of EBSD data are typically acquired at high stage tilt and slow scan speed, leading to tilt and drift distortions that obscure or distort features in the final microstructure map. In this paper, we describe TrueEBSD, an automatic postprocessing procedure for distortion correction with pixel-scale precision. Intermediate images are used to separate tilt and drift distortion components and fit each to a physically-informed distortion model. We demonstrate TrueEBSD on three case studies (titanium, zirconium and hydride containing Zr), where distortion removal has enabled characterisation of otherwise inaccessible microstructural features.
Date Issued
2021-02
Date Acceptance
2020-10-01
Citation
Ultramicroscopy, 2021, 221, pp.1-8
ISSN
0304-3991
Publisher
Elsevier BV
Start Page
1
End Page
8
Journal / Book Title
Ultramicroscopy
Volume
221
Copyright Statement
© 2020 Elsevier Ltd. All rights reserved. This manuscript is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International Licence http://creativecommons.org/licenses/by-nc-nd/4.0/
Sponsor
Royal Academy Of Engineering
Identifier
https://www.sciencedirect.com/science/article/pii/S0304399120302801?via%3Dihub
Grant Number
RF/129
Subjects
cond-mat.mtrl-sci
cond-mat.mtrl-sci
0202 Atomic, Molecular, Nuclear, Particle and Plasma Physics
0205 Optical Physics
0299 Other Physical Sciences
Microscopy
Publication Status
Published online
Article Number
113130
Date Publish Online
2020-11-04