Interfaces and defect composition at the near-atomic scale through atom probe tomography investigations
File(s)180914_-_MRS_-_invited_feature_revised.pdf (1.64 MB)
Accepted version
Author(s)
Type
Journal Article
Abstract
Atom probe tomography (APT) is rising in influence across many parts of materials science and engineering thanks to its unique combination of highly sensitive composition measurement and three-dimensional microstructural characterization. In this invited article, we have selected a few recent applications that showcase the unique capacity of APT to measure the local composition at structural defects. Whether we consider dislocations, stacking faults, or grain boundary, the detailed compositional measurements tend to indicate specific partitioning behaviors for the different solutes in both complex engineering and model alloys we investigated.
Date Issued
2018-12-14
Date Acceptance
2018-09-18
Citation
Journal of Materials Research, 2018, 33 (23), pp.4018-4030
ISSN
0884-2914
Start Page
4018
End Page
4030
Journal / Book Title
Journal of Materials Research
Volume
33
Issue
23
Copyright Statement
© Materials Research Society 2018. This paper has been accepted for publication and will appear in a revised form, subsequent to peer-review and/or editorial input by Cambridge University Press.
Subjects
Science & Technology
Technology
Materials Science, Multidisciplinary
Materials Science
FIELD-ION MICROSCOPY
PHASE-TRANSFORMATION
SOLUTE SEGREGATION
STRUCTURAL STATES
SINGLE-CRYSTALS
LATTICE-DEFECTS
STACKING-FAULTS
PLANAR DEFECTS
DISLOCATIONS
LINE
0912 Materials Engineering
0204 Condensed Matter Physics
0913 Mechanical Engineering
Materials
Publication Status
Published
Date Publish Online
2018-11-06