New techniques for imaging and identifying defects in electron microscopy
File(s)
Accepted version
Author(s)
Gianola, DS
Britton, TB
Zaefferer, S
Type
Journal Article
Abstract
Defects in crystalline solids control the properties of engineered and natural materials, and their characterization focuses our strategies to optimize performance. Electron microscopy has served as the backbone of our understanding of defect structure and their interactions, owing to beneficial spatial resolution and contrast mechanisms that enable direct imaging of defects. These defects reside in complex microstructures and chemical environments, demanding a combination of experimental approaches for full defect characterization. In this article, we describe recent progress and trends in methods for examining defects using scanning electron microscopy platforms. Several emerging approaches offer attractive benefits, for instance, in correlative microscopy across length scales and in in situ studies of defect dynamics.
Date Issued
2019-06-01
Date Acceptance
2019-06-01
Citation
MRS Bulletin, 2019, 44 (6), pp.450-458
ISSN
0883-7694
Publisher
Cambridge University Press
Start Page
450
End Page
458
Journal / Book Title
MRS Bulletin
Volume
44
Issue
6
Copyright Statement
© 2019 Cambridge University Press. This paper has been accepted for publication and will appear in a revised form, subsequent to peer-review and/or editorial input by Cambridge University Press.
Sponsor
Royal Academy Of Engineering
Grant Number
RF/129
Subjects
cond-mat.mtrl-sci
cond-mat.mtrl-sci
0912 Materials Engineering
0913 Mechanical Engineering
0303 Macromolecular and Materials Chemistry
Applied Physics
Publication Status
Published
Date Publish Online
2019-06-11