The dielectric properties of some ceramic substrate materials at terahertz frequencies
File(s)
Accepted version
Author(s)
Type
Journal Article
Abstract
The terahertz (THz) dielectric constant (εr') and dielectric loss tangent (tanδ) of the commercial LTCC materials (Ferro A6M and DuPont 951), Al2O3 (ceramic and single crystal), AlN and β-Si3N4 ceramics were measured using a vector network analyzer (VNA) over the frequency range of 140–220 GHz and a time-domain spectrometer (TDS) from 0.2 to 1.0 THz. The results from the two instruments are compared with the literature and show good agreement and consistency. For Ferro A6M, εr' = 6.06, tanδ = 0.012 at 1.0 THz. For DuPont 951, εr' = 7.67, tanδ = 0.097 at 1.0 THz. For Al2O3 ceramic and single crystal, the measured THz dielectric properties are consistent with the reported works. The dielectric constant of AlN (εr' = 8.85) and β-Si3N4 (εr' = 8.41) ceramics in the THz region is a little lower than those reported for the MHz to GHz region. These results provide valuable and much needed reference information for device designers and material scientists.
Date Issued
2019-11-01
Date Acceptance
2019-06-05
Citation
Journal of the European Ceramic Society, 2019, 39 (14), pp.4424-4428
ISSN
0955-2219
Publisher
Elsevier
Start Page
4424
End Page
4428
Journal / Book Title
Journal of the European Ceramic Society
Volume
39
Issue
14
Copyright Statement
© 2019 Elsevier Ltd. All rights reserved. This manuscript is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International Licence http://creativecommons.org/licenses/by-nc-nd/4.0/.
Subjects
Science & Technology
Technology
Materials Science, Ceramics
Materials Science
Dielectric properties
Terahertz band
Ceramic substrate materials
ACCURATE DETERMINATION
HIGH-PERFORMANCE
GHZ
AL2O3
Materials
0912 Materials Engineering
Publication Status
Published
Date Publish Online
2019-06-06