Simulation of Intrinsic Parameter Fluctuations in Decananometer and Nanometer-Scale MOSFETs

File(s)

IEEE_2003.pdf (1.33 MB)

Published version

Show more

Author(s)

Asenov, A

Brown, AR

Davies, JH

Kaya, S

Slavcheva, G

Type

Journal Article

Version

Published version

Date Issued

2003

Citation

IEEE Trans Electron Dev., 2003, 50 (9), pp.1837-1852

URI

http://hdl.handle.net/10044/1/5778

URL

http://dx.doi.org/10.1109/TED.2003.815862

ISSN

0018-9383

Start Page

1837

End Page

1852

Journal / Book Title

IEEE Trans Electron Dev.

Volume

50

Issue

9

Copyright Statement

© 2003 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works.

License URL

http://www.rioxx.net/licenses/all-rights-reserved

Source Volume Number

50

Publication Status

Published