Identifying single-electron charging islands in a two-dimensional network of nanocrystalline silicon grains using Coulomb oscillation fingerprints

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Durrani_Khalafalla et al,Identifying single-electron charging islands in a two-dimensional network of nanocrystalline silicon grains.pdf (456.06 KB)

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Author(s)

Khalafalla, M A H

Mizuta, H

Durrani, Z

Type

Journal Article

Date Issued

2006

Citation

Phys. Rev. B, 2006, 3, 74, pp.035316-1-035316-7

URI

http://hdl.handle.net/10044/1/13738

DOI

http://dx.doi.org/ 10.1103/PhysRevB.74.035316

ISSN

1098-0121

Start Page

035316-1

End Page

035316-7

Journal / Book Title

Phys. Rev. B

Volume

74

Copyright Statement

© 2006 The American Physical Society.

License URL

http://www.rioxx.net/licenses/all-rights-reserved

Description

06/05/14 meb. Publisher version, OK to add.

Edition

3