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  5. The role of lengthscale in the creep of Sn-3Ag-0.5Cu solder microstructures
 
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The role of lengthscale in the creep of Sn-3Ag-0.5Cu solder microstructures
File(s)
Gu2021_Article_TheRoleOfLengthscaleInTheCreep.pdf (7.76 MB)
Published version
OA Location
http://link.springer.com/article/10.1007/s11664-020-08697-4
Author(s)
Gu, Tianhong
Gourlay, Christopher M
Britton, T Ben
Type
Journal Article
Abstract
Creep of directionally solidified Sn-3Ag-0.5Cu wt.% (SAC305) samples with near-<110> orientation along the loading direction and different microstructural lengthscale is investigated under constant load tensile testing and at a range of temperatures. The creep performance improves by refining the microstructure, i.e. the decrease in secondary dendrite arm spacing (λ2), eutectic intermetallic spacing (λe) and intermetallic compound (IMC) size, indicating a longer creep lifetime, lower creep strain rate, change in activation energy (Q) and increase in ductility and homogeneity in macro- and micro-structural deformation of the samples. The dominating creep mechanism is obstacle-controlled dislocation creep at room temperature and transits to lattice-associated vacancy diffusion creep at elevated temperature (TTM > 0.7 to 0.75). The deformation mechanisms are investigated using electron backscatter diffraction and strain heterogeneity is identified between β-Sn in dendrites and β-Sn in eutectic regions containing Ag3Sn and Cu6Sn5 particles. The size of the recrystallised grains is modulated by the dendritic and eutectic spacings; however, the recrystalised grains in the eutectic regions for coarse-scaled samples (largest λ2 and λe) is only localised next to IMCs without growth in size.
Date Issued
2021-01-16
Date Acceptance
2020-12-10
Citation
Journal of Electronic Materials, 2021, 50, pp.926-938
URI
http://hdl.handle.net/10044/1/86467
URL
https://link.springer.com/article/10.1007%2Fs11664-020-08697-4
DOI
https://www.dx.doi.org/10.1007/s11664-020-08697-4
ISSN
0361-5235
Publisher
Electron Devices Society
Start Page
926
End Page
938
Journal / Book Title
Journal of Electronic Materials
Volume
50
Copyright Statement
© 2021 The Author(s). This article is licensed under a Creative Commons
Attribution 4.0 International License, which permits
use, sharing, adaptation, distribution and reproduc tion in any medium or format, as long as you give
appropriate credit to the original author(s) and the
source,provide a link tothe Creative Commons licence,
andindicateifchangesweremade.Theimagesorother
third party material in this article are included in the
article’s Creative Commons licence, unless indicated
otherwise in a credit line to the material. If material is
not included in the article’s Creative Commons licence
and your intended use is not permitted by statutory
regulation or exceeds the permitted use, you will need
to obtain permission directly from the copyright
holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/.
License URL
http://creativecommons.org/licenses/by/4.0/
Identifier
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000608459000001&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=1ba7043ffcc86c417c072aa74d649202
Subjects
Science & Technology
Technology
Physical Sciences
Engineering, Electrical & Electronic
Materials Science, Multidisciplinary
Physics, Applied
Engineering
Materials Science
Physics
Pb-free solder
digital image correlation
microstructural evolution
polygonisation
recrystallisation
Publication Status
Published
Date Publish Online
2021-01-16
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