Multiresolution analysis of point processes and statistical thresholding for Haar wavelet-based intensity estimation
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Accepted version
Supporting information
Author(s)
Taleb, Youssef
Cohen, Edward
Type
Journal Article
Abstract
We take a wavelet based approach to the analysis of point processes and the estimation of the first order intensity under a continuous time setting. A Haar wavelet multiresolution analysis of a point process is formulated which motivates the definition of homogeneity at different scales of resolution, termed $J$-th level homogeneity. Further to this, the activity in a point process' first order behavior at different scales of resolution is also defined and termed $L$-th level innovation. Likelihood ratio tests for both these properties are proposed with asymptotic distributions provided, even when only a single realization of the point process is observed. The test for $L$-th level innovation forms the basis for a collection of statistical strategies for thresholding coefficients in a wavelet based estimator of the intensity function. These thresholding strategies outperform the existing local hard thresholding strategy on a range of simulation scenarios. The presented methodology is applied to NetFlow data to demonstrate its effectiveness at characterizing multiscale behavior on computer networks.
Date Issued
2021-04-01
Date Acceptance
2020-03-11
Citation
Annals of the Institute of Statistical Mathematics, 2021, 73 (2), pp.395-423
ISSN
0020-3157
Publisher
Springer
Start Page
395
End Page
423
Journal / Book Title
Annals of the Institute of Statistical Mathematics
Volume
73
Issue
2
Copyright Statement
© The Institute of Statistical Mathematics, Tokyo 2020. The final publication is available at Springer via https://doi.org/10.1007/s10463-020-00753-4
Identifier
https://link.springer.com/article/10.1007/s10463-020-00753-4
Subjects
Statistics & Probability
0104 Statistics
Publication Status
Published
Date Publish Online
2020-05-08