Yield modelling and yield enhancement for FPGAs using fault tolerance schemes
File(s)
Published version
Author(s)
Campregher,N.
Cheung,P.Y.K.
Constantinides,G.A.
Vasilko,M.
Type
Conference Paper
Version
Published version
Date Issued
2005
Citation
Proceedings of IEEE International Conference on Field Programmable Logic (FPL’05), 2005, pp.409-414
ISBN
9780780393622
0-7803-9362-7
Publisher
IEEE
Source Title
International Conference on Field Programmable Logic and Applications, 24 - 26 August 2005
Start Page
409
End Page
414
Journal / Book Title
Proceedings of IEEE International Conference on Field Programmable Logic (FPL’05)
Copyright Statement
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Source
International Conference on Field Programmable Logic and Applications, 24 - 26 August 2005