Imaging individual solute atoms at crystalline imperfections in metals
File(s)1903.03288v2.pdf (934.62 KB)
Accepted version
Author(s)
Type
Journal Article
Abstract
Directly imaging all atoms constituting a material and, maybe more importantly, crystalline defects that dictate materials' properties, remains a formidable challenge. Here, we propose a new approach to chemistry-sensitive field-ion microscopy (FIM) combining FIM with time-of-flight mass-spectrometry (tof-ms). Elemental identification and correlation to FIM images enabled by data mining of combined tof-ms delivers a truly analytical-FIM (A-FIM). Contrast variations due to different chemistries is also interpreted from density-functional theory (DFT). A-FIM has true atomic resolution and we demonstrate how the technique can reveal the presence of individual solute atoms at specific positions in the microstructure. The performance of this new technique is showcased in revealing individual Re atoms at crystalline defects formed in Ni–Re binary alloy during creep deformation. The atomistic details offered by A-FIM allowed us to directly compare our results with simulations, and to tackle a long-standing question of how Re extends lifetime of Ni-based superalloys in service at high-temperature.
Date Issued
2019-12-01
Date Acceptance
2019-11-28
Citation
New Journal of Physics, 2019, 21 (12), pp.1-10
ISSN
1367-2630
Publisher
IOP Publishing
Start Page
1
End Page
10
Journal / Book Title
New Journal of Physics
Volume
21
Issue
12
Copyright Statement
© 2019 The Author(s). Published by IOP Publishing Ltd on behalf of the Institute of Physics and Deutsche Physikalische Gesellschaft. Original content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.
Identifier
https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000513663400019&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=1ba7043ffcc86c417c072aa74d649202
Subjects
analytical-field ion microscopy
atomic resolution
density functional theory
dislocation segregation
DISLOCATIONS
ENERGY
EVAPORATION
FIELD-ION MICROSCOPE
INTERFACE
IONIZATION
NICKEL
Physical Sciences
Physics
Physics, Multidisciplinary
PROBE
RHENIUM ADDITIONS
Science & Technology
SEGREGATION
time-of-flight mass-spectroscopy
Publication Status
Published
Article Number
ARTN 123020
Date Publish Online
2019-12-13