Correlative electron and X-ray microscopy: probing chemistry and bonding with high spatial resolution
File(s)
Author(s)
Goode, AE
Porter, AE
Ryan, MP
McComb, DW
Type
Journal Article
Abstract
Two powerful and complementary techniques for chemical characterisation of nanoscale systems are electron energy-loss spectroscopy in the scanning transmission electron microscope, and X-ray absorption spectroscopy in the scanning transmission X-ray microscope. A correlative approach to spectro-microscopy may not only bridge the gaps in spatial and spectral resolution which exist between the two instruments, but also offer unique opportunities for nanoscale characterisation. This review will discuss the similarities of the two spectroscopy techniques and the state of the art for each microscope. Case studies have been selected to illustrate the benefits and limitations of correlative electron and X-ray microscopy techniques. In situ techniques and radiation damage are also discussed.
Date Issued
2014-12-08
Date Acceptance
2014-12-07
Citation
Nanoscale, 2014, 7 (5), pp.1534-1548
ISSN
2040-3372
Publisher
Royal Society of Chemistry
Start Page
1534
End Page
1548
Journal / Book Title
Nanoscale
Volume
7
Issue
5
Copyright Statement
© The Author(s) 2014. The journal is © The Royal Society of Chemistry 2014.
Sponsor
Engineering & Physical Science Research Council (E
Engineering & Physical Science Research Council (EPSRC)
Grant Number
EP/D063329/1
N/A
Subjects
Science & Technology
Physical Sciences
Technology
Chemistry, Multidisciplinary
Nanoscience & Nanotechnology
Materials Science, Multidisciplinary
Physics, Applied
Chemistry
Science & Technology - Other Topics
Materials Science
Physics
ENERGY-LOSS SPECTROSCOPY
CARBON NANOTUBES
LIQUID CELL
RADIATION-DAMAGE
SPECTROMICROSCOPY
EELS
ABSORPTION
NANOPARTICLE
TOMOGRAPHY
SCALE
10 Technology
02 Physical Sciences
03 Chemical Sciences
Publication Status
Published