Finite element approximation of a phase field model for void electromigration
Author(s)
Barrett, JW
Nurnberg, R
Styles, V
Type
Journal Article
Date Issued
2004-01-01
Citation
SIAM J NUMER ANAL 42 ( 2 ) 738 - 772
ISSN
0036-1429
Copyright Statement
© Society for Industrial and Applied Mathematics
