Assessing surface-level processes during column leaching: a spatiotemporal and multilevel approach combining XPS and SEM-EDS
File(s)
Published version
Author(s)
Larrabure, Gonzalo
Batchelor, Andrew
Salinas-Farran, Luis
Neethling, Stephen J
Brito-Parada, Pablo R
Type
Journal Article
Abstract
Surface-level processes play a significant role during leaching. However, few studies have been devoted to studying the surface of samples as part of column leaching experiments. This study proposes a methodology to access information from the surface-level processes that occur during column leaching, aiming to aid the design of economically and environmentally sustainable heap leaching operations. The methodology combines the use of X-ray photoelectron spectroscopy (XPS) and scanning electron microscopy with energy dispersive spectroscopy (SEM-EDS) to investigate changes occurring at the surface. These two techniques have different surface sensitivities and thus allow the tracking of surface changes spatially (at different depths) and temporally (throughout the leaching period). The methodology also considers dividing a leaching column into a group of columns arranged in series. This allows extracting solid and solution samples from separate locations within the system without disrupting the process, thus yielding more information from a single experiment.
Date Issued
2025-08-01
Date Acceptance
2025-04-24
Citation
Minerals Engineering, 2025, 228
ISSN
0892-6875
Publisher
Elsevier
Start Page
109359
End Page
109359
Journal / Book Title
Minerals Engineering
Volume
228
Copyright Statement
© 2025 The Author(s). Published by Elsevier Ltd. This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/).
License URL
Identifier
10.1016/j.mineng.2025.109359
Publication Status
Published
Article Number
109359
Date Publish Online
2025-04-30